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Reflectance Meter Product List and Ranking from 6 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

Reflectance Meter Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. 渋谷光学 Saitama//Optical Instruments
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. Tsubosaka Electric Co., Ltd. Tokyo//Industrial Electrical Equipment
  4. 4 たきぶん Tokyo//Testing, Analysis and Measurement
  5. 4 プラムネット Kanagawa//Industrial Machinery
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Reflectance Meter Product ranking

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. X-ray Reflectivity Method 一般財団法人材料科学技術振興財団　MST
  2. Reflectance Measurement Device MSP-100 渋谷光学
  3. [Transmittance and Reflectance Measurement] LMx Series Tsubosaka Electric Co., Ltd.
  4. Reflectance measurement device たきぶん
  5. 4 Reflectance Measurement Device MSP-100 渋谷光学

Reflectance Meter Product List

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[Transmittance and Reflectance Measurement] LMx Series

[Transmittance and Reflectance Measurement] LMx Series

Custom-made to match the measurement target! We can provide a wide variety of light sources such as "color temperature" and "spectrum"!

The "LMx Series" is a product capable of measuring transmittance and reflectance. It is also possible to measure angular characteristics by varying multiple points or angles on the sample. If you want to obtain a large amount of data while changing the measurement points, the measurement labor can be significantly reduced. In addition, we offer a wide variety of light sources, including "color temperature," "luminance/illuminance," and "spectrum." Please contact us when you need assistance. 【Features】 ■ Systematization of measurement by combining a our luminance meter and light source ■ Custom manufacturing according to the measurement target ■ Measurement and display of transmittance and reflectance ■ Automation of multi-point measurements through an electric mechanism *For more details, please feel free to contact us.

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  • Optical Measuring Instruments
  • Other measurement, recording and measuring instruments

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Reflectance Measurement Device MSP-100

Reflectance Measurement Device MSP-100

Achieving high-speed, high-precision measurements of microdomains, curved surfaces, and ultra-thin samples at an unprecedented low cost.

●Price: 4,000,000 yen (excluding tax) ●If you would like a demonstration, please contact us.

  • Other physicochemical equipment

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Near-infrared reflectance meter

Near-infrared reflectance meter

Continuous measurement possible in just 3 seconds with high precision! - We will develop an original near-infrared reflectance measuring device.

We will develop and design a reflectance measurement device tailored to the specific near-infrared range according to customer needs. ◆ Wavelengths of selectable LED light sources: 750nm to 1650nm (as of July 2023) ◆ Optical system light transmission and reception method: Unidirectional illumination - integrating sphere reception method or unidirectional transmission and reception method ◆ Measurable reflectance: Total reflectance, specular reflectance, diffuse reflectance, and retroreflectance using beam splitters (half mirrors) ◆ Designable irradiation angle and reception angle: 0° to 80° MAX relative to the normal direction Furthermore, if you wish to measure the reflectance at a specific wavelength not limited to the near-infrared range, we can also manufacture reflectance measurement devices according to your requirements. ● Our self-developed measurement device features a lightweight, compact body with rechargeable capabilities ● Achieves low cost through measurements specifically focused on near-infrared wavelengths ● Capable of measuring the performance of thermal insulation products in just 3 seconds As a product version, we sell the thermal insulation property measurement device [TP-01] with 4 wavelengths.

  • Other inspection equipment and devices
  • Other electronic measuring instruments

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X-ray Reflectivity Method

X-ray Reflectivity Method

XRR：X-ray Reflectivity

XRR measures the reflection intensity of X-rays incident on the sample surface at a very shallow angle. By comparing the reflection X-ray intensity profile obtained from this measurement with simulation results and optimizing the simulation parameters, this method determines the film thickness and density of the sample. - Evaluation of film thickness is possible (approximately 2 to 300 nm) - Evaluation of density is possible - Evaluation of surface roughness is possible (Rms ≤ 5 nm) - Non-destructive analysis is possible - Average information over a wide area of approximately 10×20 mm can be obtained

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  • Contract Analysis
  • Contract measurement
  • Contract Inspection

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Reflectance Measurement Device MSP-100

Reflectance Measurement Device MSP-100

Achieved at an unprecedented low cost.

- By adopting a special half-mirror (patented), it cuts off back surface reflection light, allowing for accurate measurements in a short time without any back surface treatment. (Measurement of reflectance for a thin plate of 0.2mm is possible: using a ×20 objective lens) - It is also possible to measure lens curvature and coating unevenness. (Connecting micro spots (φ50μm) on the sample surface) - High reproducibility measurements can be achieved in a short time even for low-reflectance samples. (Thanks to a unique optical design that maximizes light intake, it features a 512-element linear PDA, a built-in 16-bit A/D converter, and a USB2.0 interface for fast calculations) - Colorimetric measurements and L*a*b* measurements are possible. Object measurements can be performed based on spectral reflectance using spectrophotometry. - Data can be saved in Microsoft Excel(R) format. - Single-layer films can be measured non-contact and non-destructively. - It has a function to display multiple measurement results on the same screen, making it easy to compare results.

  • Other measurement, recording and measuring instruments

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Reflectance measurement device

Reflectance measurement device

Reflectance measurement device

This is a spectrophotometer that allows for easy measurement of reflectance. It is an integrated unit with a spectrometer, light source, and fiber, enabling simple and instantaneous measurements without the need for complicated settings or optical axis adjustments. With a light source and CCD/InGaAs detector, it enables high-sensitivity and high-speed measurements of 20 to 100 spectra per second over the range of 250nm to 1700nm.

  • Microscope

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[Analysis Case] Measurement of Film Density and Film Thickness of Organic EL Device Stacked Films

[Analysis Case] Measurement of Film Density and Film Thickness of Organic EL Device Stacked Films

X-ray reflectivity measurement (XRR) allows for non-destructive analysis of film thickness and density.

Organic EL displays are advancing in practical applications by leveraging advantages such as high brightness, high-resolution color, and thinness due to their self-emissive principle. Organic EL devices are manufactured by stacking organic films, but analyzing the organic films in their stacked state has been challenging. This time, by using the XRR method, it has become possible to measure the film thickness and density of the organic films while maintaining the stacked state. Analysis of the thickness and density of stacked films is possible regardless of whether they are crystalline or amorphous.

  • Contract Analysis

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Evaluation of thin films using X-ray reflectivity measurement (XRR)

Evaluation of thin films using X-ray reflectivity measurement (XRR)

If the membrane structure and composition information is known in advance, multilayer membranes can also be evaluated through simulation!

We would like to introduce our "Thin Film Evaluation using X-ray Reflectivity Measurement (XRR)." X-ray Reflectivity Measurement (XRR) allows us to obtain information about surface (interface) roughness, film density, and film thickness by fitting the X-ray profile, which shows attenuation and interference fringes near total external reflection, with a calculated profile. Please feel free to contact us if you have any inquiries. 【Thin Films that can be Analyzed】 ■Sample Surface: Mirror-like (Surface Roughness less than 5nm) ■Sample Size: 30mm x 30mm or larger *Please consult us if the size is smaller ■Film Thickness: 2nm to 500nm ■Required Information: Film structure and film composition information *For more details, please download the PDF or feel free to contact us.

  • Other analysis and evaluation services

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